CHARACTERIZATION OF MATERIALS
635:309 Dr. Stephen H. Garofalini (A217)
shg@rutgers.edu http://glass.rutgers.edu
| All class notes and materials from this class are protected by copyright laws. See below (page bottom). |
| Description: The course covers the interactions of electromagnetic radiation, electrons, and ions with materials and their application in various spectroscopies and microscopies in the characterization of materials. Students learn the benefits and limitations of techniques such as x-ray diffraction and x-ray, IR, UV, electron and ion spectroscopies and various electron microscopies and scanning probe microscopy. |
| TOPIC | CLASSES | READING* | HOMEWORK |
| 1. Purpose and scope |
1 |
. | |
| 2. Review of crystallography, unit cell notation |
2 |
C-ch.2 (<2.10) | HW 1 due Sept 12 |
| 3. Nature of x-rays, EM spectrum, generation of x-rays, various spectra, Bohr model and transitions, "particles in...particles out" |
2 |
C-ch.1 | HW 2 due Sept 17 HW 3 due Sept 17 |
| 4. Interaction of EM radiation with matter, absorption, filters |
2 |
C-ch.1 | |
| 5. X-Ray Diffraction, Bragg's law |
2 |
C-ch.3 | HW 6 due Sept 26 |
|
6. Intensities of diffracted beams, scattering, form factor, structure factor |
3 |
C-ch.4 | HW 7 due Oct 15 |
| Exam 1** |
1 |
||
| 7. Counters |
1 |
C-ch.7.5 - 7.7 | HW 8 due Oct 24 |
| 8. XRF, EXAFS |
2 |
B-ch. 4.2, B-ch. 6.1 | HW 9 due Nov 12 |
| 9. Surface spectroscopies based on electrons or photons in: XPS, UPS, AES |
3 |
B-ch.5.1 - 5.3 |
|
| 10. Surface spectroscopies based on ions in: ISS, SIMS, RBS |
2 |
B-ch 9.1, 9 .4 | |
| Exam 2** |
1 |
||
| 11. Microscopies: SEM, TEM, Cz-TEM, HAADF-STEM, SPM |
5 |
B- ch. 2: pgs 72-75, 85-95, 99-104 |
HW 10 due Nov. 21 |
| 12. Vibrational spectroscopies: IR and Raman |
1 |
B-ch. 8.1, 8.2 | . |
| EXAM 3 |
|
ALL READING | . |
*Initial overview 'Reading' should be completed prior to the first class covering the Topic shown;
B = Encyclopedia of Materials Characterization, C. R. Brundel, C. A. Evans, and S. Wilson; C = Cullity Elements of X-Ray Diffraction;
Chapters from Brundel and Cullity are available for your personal use only during the course.
Additional Reading on the website provides more information on specific topics. Various Tables of data used in the course are also on the website.
** Scheduling of exams is approximate, not fixed.
Office Hours: TBD
No electronic equipment to be used in class (tablets, phones, etc.). Please keep cell phones turned off and stowed away during class time.
GRADE: The final grade for the course will be compiled approximately as follows:
Class Participation ~10%, HW + Quizzes ~35%, Exams & Challenges ~55% ( the ~ symbol means 'approximately')
Homework assignments will be mentioned in class, but check this syllabus daily for details regarding homework and due dates.
ACADEMIC INTEGRITY: Plagiarism is a major offense at Rutgers University. You are responsible for understanding the academic integrity policy and following these principles. The complete academic integrity policy can be found here: http://academicintegrity.rutgers.edu/.
These class notes and materials are protected by copyright laws. The copyright ownership of the notes and materials vests in the Professor teaching the course. The copyright owner of the videocasts grants you a non-exclusive and limited license for your own personal use during the course. Sharing them with others (including other students), reproducing, distributing, or posting any copyright protected part of the videocasts elsewhere—including but not limited to any internet site—will be treated as a copyright violation.